Method and Apparatus for Performing Spectroscopy Downhole with a Wellbore

ABSTRACT

An analysis system, tool, and method for performing downhole fluid analysis, such as within a wellbore. The analysis system, tool, and method provide for a tool including a spectroscope for use in downhole fluid analysis which utilizes an adaptive optical element such as a Micro Mirror Array (MMA) and two distinct light channels and detectors to provide real-time scaling or normalization.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a Continuation of U.S. patent application Ser. No.12/342,650 filed Dec. 23, 2008, now U.S. Pat. No. 7,728,971, which is inturn a Continuation of U.S. patent application Ser. No. 11/865,587 filedOct. 1, 2007, now U.S. Pat. No. 7,508,506, which in turn claims benefitof U.S. Provisional Patent Application Ser. No. 60/827,837 filed Oct. 2,2006 and is also a Continuation-in-Part (CIP) of U.S. patent applicationSer. No. 11/696,005, filed Apr. 3, 2007, now U.S. Pat. No. 7,440,098,which in turn claims benefit of U.S. Provisional Patent Application Ser.No. 60/827,837, filed Oct. 2, 2006 and U.S. Provisional PatentApplication Ser. No. 60/744,246, filed Apr. 4, 2006. The entiredisclosure of all of these documents is herein incorporated byreference.

BACKGROUND

1. Field of the Invention

This invention relates generally to the field of spectroscopy andspectrum analysis, more particularly, to an analysis system, tool, andmethod capable of performing optical or other spectral fluid analysiswithin a wellbore by utilizing a sample and reference channel and aMicro Mirror Array (MMA) to provide real-time scaling or normalization.

2. Description of the Related Art

A variety of systems are used in wellbore geophysical exploration andproduction operations to determine chemical and physical parameters ofmaterials in the wellbore environs. The wellbore environs includematerials, such as fluids, in the vicinity of a wellbore as well asmaterials, such as fluids, within the wellbore. The various systemsinclude, but are not limited to, wireline formation testers, drillingformation testers, production logging systems, under-balanced drillingsystems, wellbore fluid analysis systems conveyed within the wellbore,and fluid analysis and monitoring systems disposed permanently withinthe wellbore.

Wireline formation tester systems are used in the oil and gas industryprimarily to measure pressure of a formation penetrated by a wellboreand to collect and analyze fluids from the wellbore environs todetermine major constituents within the fluid. Wireline formationtesting systems are also used to determine a variety of properties ofthe formation in the vicinity of the wellbore. These formationproperties, combined with analyses of physical and chemical propertiesof the formation fluid, can be used to predict and evaluate productionprospects of reservoirs penetrated by the wellbore.

Regarding formation fluid sampling, it is of prime importance that fluidcollected for analysis represents formation fluid with minimalcontamination from fluids used in the wellbore drilling operation.Various techniques have been used to minimize sample contaminationincluding the monitoring of fluid pumped through a downhole instrumentor section or sections of the downhole wireline formation tester toolsystem until one and/or more fluid properties, such as resistivity,cease to change as a function of time.

The formation testing tool utilizes isolation elements such as straddlepackers or doughnut-shaped pad packers that contain one or multipleports These elements seal against the formation to isolate a region ofthe formation from the interior of the wellbore allowing the formationto be sampled in relative isolation. Fluids from within the formationare pumped directly through the port or ports from within the isolatedformation and are then pumped through the formation tester tool sectionsvia one or more flowlines. Within the tool are a plurality ofinstruments or sensors for analyzing the fluid. The fluid, whichcontains crude components (solid, liquid, and/or gas) as well asdrilling mud filtrate or other contaminants, flows through the formationtesting tool and is analyzed. When it has been determined that mudfiltrate or other contamination has been minimized, the fluid can beretained within sample cylinders within the tool and typically returnedto the surface of the earth for more detailed chemical and physicaltesting.

In addition to sample gathering, fluid analyses within the downhole tooltypically include the determination of oil, water and gas constituentsof the fluid. Sometimes the instruments and sensors are used to analyzefluid properties of the fluid from a particular region of the formationdownhole and no sample is saved to return to the surface. This analysismay be used, for example, to determine connectedness of the reservoir byexamining and identifying the fluids that occur in that particularcompartment of the reservoir. Furthermore, it is desirable to determinethe concentrations of methane, CO₂, H₂S, hydrocarbons (C_(n), where n=2,. . . , 6+), or water, as well as certain metals within the fluids.Often, it is desirable to obtain multiple fluid analyses or samples as afunction of depth within the wellbore. Operationally, it is desirable toobtain these multiple analyses and/or samples during a single trip ofthe tool within the well.

Formation tester tools can be conveyed along the wellbore by a varietyof means including, but not limited too, a single or multi-conductorwireline, a “slick” line, a drill string, a permanent completion string,or a string of coiled tubing. Tool response data and information as wellas tool operational data can be transferred to and from the surface ofthe earth using wireline, coiled tubing and drill string telemetrysystems. Alternately, tool response data and information can be storedin memory within the tool for subsequent retrieval at the surface of theearth.

For carrying out fluid analysis, spectroscopes such asspectrophotometers, spectrometers, spectrofluorometers, or spectrumanalyzers are used in numerous situations to detect and provide spectralcharacteristics of a test fluid. These characteristics can then be usedto provide an analysis of the chemical and/or physical properties of thefluid for reservoir description and modeling, production planning, andother hydrocarbon exploration and production tasks. Spectroscopestypically utilize some form of electromagnetic radiation (EM) to performfluid analysis. The wavelength of this EM radiation can be in the x-rayrange, the gamma radiation range, the ultraviolet range, the visiblerange, the infrared range, or any combination of these ranges ofradiation.

Prior spectroscopes are typically physically large devices due to thenecessity of splitting the EM radiation into various components. Manyspectroscopic systems that utilize spectrum analysis are alsoconstrained by their ability to utilize a limited number of spectralanalysis techniques and by their hardware configuration. Once built,generally the spectrum can only be analyzed temporally or spatially, butnot both. Because of the typically harsh environment in which a downholetool operates, prior downhole spectroscopes have been severely limitedby the number of discrete channels they can process. Furthermore, priorspectroscopes are typically dependent upon their ability to remaincalibrated as they analyze or scan. This can be very difficult inspectroscopes utilized in a downhole tool as the spectroscopes oftenrequire near constant operator interaction to adjust for changingsystematic factors, and to continually check and adjust calibration to a“standard” calibration. All of these characteristics of prior systems,therefore, typically render most spectroscopes relatively unsuitable forreal-time analysis of flowing fluid in a downhole wellbore environment.

In addition to formation testing systems, production logging systems, aswell as permanently installed systems, are used in the oil and gasindustry to identify the location, type and amount of fluid flowingthrough or entering a wellbore as a function of time and/or depth withinthe wellbore. Preferably, volume flow rates of each of oil, water andgas is measured as a function of time and/or depth. Production logs aretypically used to monitor the production performance of existing wells.As well, production logs can be used to evaluate completions of newlydrilled wells and to diagnose production and casing problems for olderexisting wells. Determination of constituents and/or properties of thefluid combined with volume flow rates of the oil, water, and/or gasconstituents provide a powerful tool to make production, completion, orworkover decisions about the well.

Downhole fluid analysis systems are not only used in discrete monitoringevents. Systems for downhole monitoring can also be used in the oil andgas industry to monitor constituents of fluid flowing within a wellboreas a function of time and/or depth, where the monitoring time can spandays or even weeks. Once again, such systems require a measure ofconstituents and/or properties of the fluid in the tool and undersimilar conditions as discussed above.

SUMMARY

The following is a summary of the invention in order to provide a basicunderstanding of some aspects of the invention. This summary is notintended to identify key or critical elements of the invention or todelineate the scope of the invention. The sole purpose of this sectionis to present some concepts of the invention in a simplified form as aprelude to the more detailed description that is presented later.

Because of these and other problems with the art, described herein is atool for performing, downhole analysis of a fluid the tool comprising: aport for obtaining a sample of fluid downhole; and a spectroscope, thespectroscope including: a sample channel that evaluates said formationfluid; a reference channel; and a Micro Minor Array (MMA) comprisingelements that are sequentially oriented to direct light, at samplewavelength, into the sample channel and into the reference channel;wherein response of the sample channel and response of the referencechannel are combined to yield a measure of a property of said formationfluid and to correct the measure for systematic changes in thespectroscope. In an embodiment, the system determines, within the tool,chemical and physical properties of fluids that are brought into contactwith a sensor.

In an embodiment, the tool may be part of a wireline formation testersystem, a production logging system, a downhole fluid analysis system, aLogging While Drilling (LWD) formation tester system or a Measurementwhile Drilling (MWD) formation tester system (an LWD/MWD formationtester system).

There is also described herein a system for measuring properties of afluid from within a wellbore, the system comprising: a tool, the toolincluding; a wellbore isolation element for isolating a portion of anearth formation; a port for obtaining a sample of formation fluid fromsaid isolated portion; and a spectroscope, said spectroscope including:a light source; a Micro Mirror Array (MMA) which is used for wavelengthfiltering; a sample channel comprising a sampling accessory in opticalcontact with the fluid; a sample detector; and a reference channelcomprising a reference detector; a control system that orients elementsof said micro mirror array such that light at a sample wavelength isdirected into said sample channel, and alternately orients elements ofsaid micro minor array such that the light at said sample wavelength isdirected into said reference channel; and a processor for combiningresponses of said sample detector and said reference detector to obtaina measure of at least one property of a fluid within a wellbore and tocorrect the measure for systematic changes in said spectroscope.

In another embodiment, the spectroscope further comprises means fordetermining spectroscope dark current. In a further embodiment, thecontrol system orients elements of the MMA such that the light isdirected away from either the sample channel or the reference channel,and responses of the reference detector and sample detector,respectively, are used to determine the respective channel darkcurrents. In an embodiment, these measurements are used subsequently tocorrect spectroscope measurements for the adverse effects of backgrounddrift.

In a still further embodiment, the tool further comprises a spectroscopetool section in which the spectroscope is disposed, and a probe or porttool section through which the fluid flows into the spectroscope toolsection.

In another embodiment, the tool further comprises a pump tool section,and means for isolating the probe or port tool section so that the fluidcan be drawn into the tool from earth formation penetrated by thewellbore.

In an embodiment, the system further comprises a surface telemetry unit,an electronics and telemetry tool section disposed in the tool, whereinthe electronics and telemetry system comprises a downhole telemetryunit, and a data conduit operationally connecting the downhole telemetryunit with the surface telemetry unit thereby allowing the measure of theproperty to be sent by telemetry to the surface equipment.

There is also described herein a method for measuring a property of afluid within a wellbore, the method comprising: disposing a spectroscopewithin the wellbore, the spectroscope comprising a sample channel thatinteracts with a fluid, a reference channel, and a Micro Mirror Array(MMA) comprising micro minor elements; sequentially orienting the micromirror elements to direct light, at a sample wavelength, into saidsample channel and into said reference channel; and combining a responseof said sample channel and a response of said reference chamber toobtain a measure of a property of the fluid and to correct the measurefor systematic changes in the spectroscope.

This method may be performed by a wireline formation tester system, aLogging While Drilling (LWD) formation tester system or a MeasurementWhile Drilling (MWD) formation tester system (an LWD/MWD formationtester system), a production logging system, or a downhole fluidanalysis system.

There is also described herein a tool for measuring properties of aformation fluid downhole within a wellbore, the tool comprising: meansfor isolating a portion of an earth formation; means for obtaining asample of formation fluid from said isolated portion; means forevaluating a property of said formation fluid; and means allowingcorrection of systemic changes in said evaluation while said tool isdownhole within said wellbore.

In another embodiment, the spectroscope utilizes an adaptive opticalelement such as an MMA, which is capable of providing real time scalingor normalization by utilizing two separate collection channels or lightpaths, and which is usable in a formation tester system.

In an embodiment, the spectroscope comprises: an MMA comprising aplurality of minors, each of which is switchable between a first and asecond position, a light source having a spectrum, and at least twodetectors; wherein the light source is spatially dispersed across theMMA in such fashion that a first group of the mirrors, can direct afirst portion of the spectrum along a first light path to a first of theat least two detectors by being placed in the first position; andwherein a second position of the minors can direct a second portion ofthe spectrum along a second light path to a second of the at least twodetectors by being placed in the second position.

Depending on the embodiment of the spectroscope, the light source may bea broad band light source or a narrow band light source. The first lightpath includes a sample to be analyzed while the second light path doesnot include a sample to be analyzed so the output from the seconddetector can be used as a reference for output from the first detector.

In an embodiment, the MMA comprises a Digital Micromirror Device (DMD).

In another embodiment, the spectroscope further comprises an input slitthrough which the light passes prior to reaching the MMA. Columns of thespectrum can correspond to a spectral dimension of dispersion and rowscorrespond to a spatial dimension of the input slit. The plurality ofminors may be arranged into a plurality of rows and columns wherein thecolumns of the spectrum are incident on the MMA so as to align with thecolumns of minors or wherein the columns of the spectrum are incident onthe MMA so as to align with a diagonal of the rows and the columns ofthe minors

In another embodiment, the MMA performs spectral separation of thespectrum.

In another embodiment, the MMA can reversibly direct the first portionalong the first and the second path and the second portion along thefirst and the second path in such fashion that when one of the portionsis directed to the first path, the other of the portions is directed tothe second path and vice-versa.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 provides an overview of an embodiment of a wireline formationtester system and tool operating downhole within a wellbore.

FIG. 2A is a conceptual diagram of an embodiment of a spectroscopeutilizing multiple channels disposed within the spectroscope toolsection of an embodiment of a tool. FIG. 2B illustrates a single micromirror of a Micro Mirror Array (MMA) oriented to direct light into thesample channel of the spectroscope. FIG. 2C illustrates a single micromirror of an MMA oriented to direct light into the reference channel ofthe spectroscope.

FIG. 3 is a conceptual diagram of another embodiment of a spectroscopeutilizing sample and reference accessories.

FIG. 4 is a conceptual diagram of another embodiment of a spectroscopeutilizing a light source incident on a sample prior to being incident onan MMA.

FIG. 5 provides for an embodiment of an optical path.

FIG. 6 provides for an alternative embodiment of an optical path.

FIG. 7 provides for another embodiment of an optical path.

FIG. 8 is a conceptual diagram of the dual channel processingcapabilities of an embodiment of a spectroscope. FIG. 8A shows a firstwavelength directed to the reference channel with all other wavelengthsdirected to the sample channel. FIG. 8B shows the first wavelengthdirected to the sample channel with all other wavelengths directed tothe reference channel.

FIG. 9 provides a side (FIG. 9A), top (FIG. 9B), and end (FIG. 9C) viewof the internal design of a first embodiment of a spectroscope.

FIG. 10 provides a conceptual diagram of the internal design of aspectroscope using two separate inputs and measuring two samples.

FIG. 11 provides for positioning of a spectrum on an MMA. In FIG. 11A,the spectrum is aligned with the MMA, while in FIG. 11B the spectrum isangled across an MMA.

FIG. 12 provides for a graph showing how the spectroscope can be usedfor dynamic resolution control.

FIG. 13 provides a graph of how the spectroscope can be used to improvedynamic signal to noise ratio.

FIG. 14 provides a graph of how the spectroscope can be used for dynamicfiltering.

FIG. 14A shows a graph before filtering while FIG. 14B shows the samegraph after filtering.

FIG. 15 provides a graph of how the spectroscope can be used for dynamicscaling.

FIG. 16 provides for two indications of how wavelength segments of thespectrum can be modulated to provide for Fast Fourier Transform (FFT)analysis (FIG. 16A) and optical chopping (FIG. 16B).

FIG. 17 illustrates a sample spectrum measured with an embodiment of thespectroscope illustrating oil, water, and gas constituents in the fluid.

DESCRIPTION OF THE PREFERRED EMBODIMENT(S)

The following detailed description illustrates by way of example and notby way of limitation. There is discussed herein a system for performing,downhole within a wellbore, a spectroscopic analysis of a fluid. Thereis also discussed a downhole tool including a spectroscope forperforming such analysis of a fluid down holes within a wellbore. Basicconcepts of the spectroscope are presented with the system exemplarilyembodied as a formation tester system. However, in alternativeembodiments the spectroscope can be embodied in systems such as, but notlimited to, a production logging system and a wellbore fluid samplingand analysis system.

FIG. 1 illustrates conceptually the major elements of an embodiment of aformation tester system (5) operating downhole in a wellbore (28) thatpenetrates an earth formation (42). The embodiment of FIG. 1 is anexemplary embodiment of a more general downhole fluids analysis device.Further, the device of FIG. 1 is provided conceptually and is notintended to convey specific scale or location. The embodiment of FIG. 1is typical of a wireline formation tester, however, the devices,systems, and methods discussed herein can be used in a variety of toolsincluding, but not limited to, wireline formation testers, productionlogging tools, formation testers in use during drilling—Logging WhileDrilling/Measurement While Drilling (LWD/MWD) formation testers,downhole fluid analysis tools, or any other downhole tool known to thoseof ordinary skill in the art. Further, while a formation tester systemas discussed herein is intended to be sent downhole and then retrieved,the systems, devices, and methods are also useable in permanent orsemi-permanent downhole monitoring systems.

A formation tester system (5) generally comprises a formation testertool (10) that is conveyed within a wellbore (28) by a conveyor (30).The formation tester wellbore instrument, or “tool” as it may bereferred to herein, is denoted as a whole by the numeral (10). Theconveyor means (30) is disposed at the surface of the earth, andcooperates with a tubular or a cable (26) that can serve as a dataconduit between the tool (10) and the conveyor (30). The conveyor (30)is operationally connected to surface equipment (32), which may providea variety of functions including processing tool (10) response data,controlling operation of the tool (10), recording measurements made bythe tool (10), tracking the position of the tool (10) within thewellbore (28), and the like.

The formation tester tool (10) comprises a plurality of operationallyconnected sections which may be disposed within a housing or a drillcollar. These sections may include a probe or port tool section (12), anauxiliary monitoring tool section (14), a spectroscope tool section(16), a pump tool section (20), and an electronics and telemetry toolsection (22). A processor is preferably disposed within each section ofthe tool (10).

Again referring to FIG. 1, fluid is generally drawn into the tester tool(10) through a probe or port tool section (12). For the sole purpose ofease of discussion, it will be assumed that the probe or port toolsection (12) comprises a port configured as a probe, and the section(12) will hereafter be referred to as the “probe” section (12) althoughthat term is in no way intended to require a port configured as a probe.The probe section (12) can comprise one or more intake ports, which arenot shown. Fluid flow into the probe section (12) is illustratedconceptually with the arrow indicating the draw of formation fluid (36)from within the earth structure (42) and into the probe section (12).

So as to reduce contamination of sampled fluid obtained by the probedsection (12), the section of earth formation (42) will generally beisolated from the wellbore (28) so as to improve the ability to withdrawformation fluid from the earth formation (42) and to not obtain samplesof fluid within the wellbore (28). During the wellbore drillingoperation, the wellbore fluid and fluid within or near the wellboreformation can be contaminated with drilling fluid typically comprisingsolids, fluids, and other materials. Drilling fluid contamination offluid (36) drawn from the earth formation (42) may be minimized usingvarious means of inhibiting such contamination. These include, but arenot limited to, using one or more probes in cooperation with a wellboreisolation element such as a pad packer type device (not shown) that isurged against the wall of the earth formation (42). One or more probesextend through the pad into the earth formation (42). Alternately, theportion of the formation to be sampled can be isolated from the wellboreby one or more packers (not shown). A plurality of packers can beconfigured axially as “straddle” packers. Straddle packers and their useare disclosed in U.S. Pat. No. 5,337,621, the entire disclosure of whichis herein incorporated by reference.

Still referring to FIG. 1, fluid (36) may pass from the probe section(12) through appropriate flow lines (not shown) and into the auxiliarymonitoring tool section (14). The auxiliary monitoring tool section (14)can comprise one or more sensors (not shown) that can measure variousphysical parameters of the fluid such as, but not limited to,resistivity, dielectric potential, temperature, density, viscosity, ormass. The fluid then passes within appropriate flow lines (not shown)into the spectroscope tool section (16), where chemical and/or physicalanalyses are performed on the fluid while the tool (10) is disposedwithin the wellbore (28).

The rate of fluid flow through the tool (10) can be measured andcontrolled. As discussed in detail in the preceding and followingsections of this disclosure, a spectroscope such as spectroscope (100)(discussed later) is deployed within the spectroscope tool section (16)or any other suitable location and performs optical or alternately othertypes of spectral measurements on the fluid (36) from whichconcentrations of constituents and/or other chemical or physicalproperties of the fluid (36) are determined. These measurements may alsobe processed to identify and to determine chemical and/or physicalproperties of the fluid (36). The spectroscopic measurements andchemical and/or physical properties can be preferably made in real-timeand at a plurality of axial positions or “depths” during a single tripof the tool (10) in the wellbore (35). Furthermore, a plurality ofmeasurements can be made at a single depth during a single trip of thetool (10) in the wellbore (35). The spectroscope (100) can also bedeployed as part of a permanent completion within the wellbore (28). Thespectroscope (100) can be deployed by any means known to thoseordinarily skilled in the art and is not intended to be limited to theexemplary methods described herein.

In one embodiment the spectroscope may be comprised of a Micro OpticalElectro Mechanical System (MOEMS) which is fabricated typically from aplurality of micro mirror devices. A MOEMS device for this purposeincludes, but is not limited to, any commonly used description for thesedevices such as DMD, DLP, or MMA. For purposes of clarity all of thesecommon names will be referred to as a Micro Mirror Array (MMA) forsubsequent discussion. In addition to other benefits, an MMA can be usedto provide real-time instrument sensitivity calibration, dark currentcorrection, and corrections for system drift including gain and baselinedrift. Construction of the spectroscope is robust making it suitable foruse in typically harsh wellbore conditions. In addition, thespectroscope is adaptable to a variety of wellbore conditions, andversatile in operation as will become apparent in subsequent sections ofthis disclosure.

Again referring to FIG. 1, the fluid may be directed to the sample toolsection (18), via appropriate flow lines (not shown), after passingthrough the spectroscope tool section (16). Fluid samples can beretained within one or more sample containers within the sample toolsection (18) for return and to the surface for additional analysis. Thesurface is typically the surface of earth formation (42) or the surfaceof any water covering the earth formation (42), as may be the case whenthe wellbore is generated in an ocean floor or similar structure.

Fluid may be drawn into the probe tool section (12), pumped through theauxiliary and spectroscope tool sections (14) and (16), respectively,optionally pumped into sample containers within the sample tool section(18), and optionally purged into the wellbore (28) by one or more pumptool sections (20) disposed in the tool (10). Power for all of thepreviously discussed sections of the tool (10), operation of the tooland the various elements within the tool, and transfer of data andcommands into and out of the tool, may be provided and controlledthrough the electronics and telemetry tool section (22). A processorwithin the spectroscope tool section (16) is preferably used to processdata measured by the spectroscope tool section (16), and to controloperation of the spectroscope within the spectroscope tool section, aswill be subsequently discussed. The fluid flow paths described areexemplary and are not intended to limit the methods by which the tool(10) can be deployed as sections can be used in alternative orders andfluid flow need not be linear.

Once again referring to FIG. 1, the upper end of the tool (10) may beterminated by a connector (24). The tool (10) may be operationallyconnected to a conveyor (30) disposed at the surface by means of atubular, cable (26), or similar structure designed to interconnect. Morespecifically, the lower or “wellbore” end of the cable (26) isoperationally connected to the tool (10) through the connector (24). Theupper or “surface” end of the cable (26) is operationally connected tothe conveyance means (30). In an embodiment, the cable (26) can functionas a data conduit between the tool (10) and equipment disposed at thesurface.

In an embodiment, the tool (10) is a logging tool element of a wirelineformation tester system, and the cable (26) is a multi-conductorwireline logging cable and the conveyance means (30) is a wireline drawworks assembly comprising a winch. In another embodiment, the tool (10)is a component of a measurement-while-drilling or logging-while-drillingsystem, the cable (26) is a drill string and the conveyor (30) is arotary drilling rig. In a still further embodiment, the tool (10) is anelement of a coiled tubing logging system, the cable (26) is coiledtubing and the conveyor (30) is a coiled tubing injector. In a stillfurther embodiment, the tool (10) is an element of a drill string testersystem, the cable (26) is again a drill string and the conveyor (30) isagain a rotary drilling rig. Other embodiments of the tool (10), cable(26) and conveyor (30) would be readily understood by a person ofordinary skill in the art.

Again referring to FIG. 1, surface equipment (32) may be operationallyconnected to the tool (10) through the conveyor (30) and the structure(26). The surface equipment (32) may comprise a surface telemetryelement, which communicates with the downhole telemetry unit disposedwithin the electronics and telemetry tool section (22). The cable (26)functions as a data conduit between the downhole and surface telemetryelements. The surface unit (32) may also comprise a surface processorthat optionally performs additional processing of data measured in thespectroscope tool section (16).

In another embodiment, the surface processor may also cooperate with adepth measure device (not shown) to track data measured by the tool (10)as a function of depth (40) within the wellbore at which it is measured,or the surface equipment (32) may comprise recording means for recording“logs” of one or more parameters of interest as a function of timeand/or depth. The surface equipment (32) may comprise any data ormechanical-based machine, circuitry, computer, or other device toperform any desired function.

While this disclosure will also generally refer to the device within thespectroscope tool section (16) of the tool (10) as a “spectroscope” itshould be recognized that this term is not being used to refer to aparticular type of spectral evaluation device but is intended to refergenerally to a class of devices used in conjunction with the review,evaluation, or analysis of spectrums. It is not required that allspectrum evaluations or analysis devices used in a spectroscope be usedin this device. The device can be used in any kind of real-time or otherprocess spectroscopy monitoring including, but not limited to, opticalmonitoring, spectrophotometry, spectrofluorometry, spectrum analysis,spectrocolorimetry, and spectroradiometry.

Generally, the spectroscope (100) includes optical components to shape,manipulate, or route incident light to targets of interest, spectrallydisperse incoming light, image the dispersed light onto a spatial,spectral, or temporal filtering device, direct the filtered light onto,into, or around (bypassing) a sample, and then direct the light to sometype of optical detector. The spectroscope (100) of the presentdisclosure provides for multiple detectors each of which is associatedwith its own optical channel, or light path. In the depictedembodiments, two channels are shown as this is generally the preferrednumber, however, in alternative embodiments more may be used.

In addition to determining chemical and/or physical properties of thefluid, the spectroscope (100) embodied in the tool (10) may be capableof real-time dark current correction and pre-scan or post-scanreferencing of any illumination source. Dark current is also known asdark noise and by other common names.

The spectroscope (100) may be controlled by a processor disposedpreferably within the spectroscope tool section (16). In an embodiment,commands can be preprogrammed in the processor. Alternately, commandscan be input from the surface equipment (32) in real time such as viathe previously discussed telemetry system. The processor controls theoperation of the spectroscope (100) and, in an embodiment, can be usedin processing results obtained from the spectroscope's (100) response tofluid.

Embodiments of a spectroscope (100) which may be used in the tool (10)are further described in U.S. patent application Ser. No. 11/696,005,the entire disclosure of which is incorporated herein by reference.

Referring to FIGS. 2 through 4 which provide for various embodiments ofspectroscope (100) which may be used in different embodiments of tool(10), light is generally delivered to the spectroscope (100) via opticalfiber or free-space delivery from a light source (102). The opticalfiber delivery methodology is generally preferred. The light source(102) will generally be operable in typically harsh wellbore (28)conditions and will be located within the spectroscope tool section(16), but that is by no means required. The light source (102) may beprovided by a single source such as, but not limited to, tungstenfilament, metal halide, incandescent light, or any source known or yetto be discovered. Light can also be obtained by any combination ofsources including, but not limited to, light emitting diodes (LED's),lasers, arc sources, and the like.

Further, while the embodiments of the spectroscope (100) discussedherein are capable of manipulating all wavelengths of electromagneticradiation, the remaining discussion will focus on the wavelength rangesof the ultraviolet, visible, near infrared and mid infrared regions asthe electromagnetic spectrum being used. Further, the radiation will bereferred to using the term “light” even though the spectrum is intendedto include wavelengths outside the bounds of visible light in at leastsome embodiments.

The light source (102) will generally comprise a broadband light sourceemitting a number of different wavelengths of light simultaneously suchas, but not limited to, natural solar radiation, a tungsten filament, orany combination of narrow band sources. In an alternative embodiment,the light source (102) may comprise a single narrow band or singlewavelength source such as, but not limited to, light emitting diodes orlasers; an electrically charged gas such as neon that emits a narrowband or a number of narrow bands, or any other light source known tothose of ordinary skill in the art. The light can be provided to thespectroscope (100) device discussed herein by any method known to one ofordinary skill in the art including, but not being limited to, beingreflected, refracted, focused, or diffused prior to reaching thespectroscope (100).

In FIGS. 2A, 2B, and 2C the two detectors (201) and (203) which are partof the spectrometer are accessed through one of two optical channels(211) and (213). One optical channel (213) is capable of directing lightto a sampling accessory (204), such as, but not limited to, a fiberoptic probe, a cuvette assembly, or another device as would beunderstood by one of ordinary skill in the art. The second opticalchannel (211) is generally used as an optical reference channel forcalibration and therefore does not include a sampling accessory (204).However, in alternative embodiments the second optical channel (211)could be used as a secondary data channel in some applications, such asspectroradiometery or spectralfluorimetry, to improve Signal-to-Noise(S/N) and/or to enhance data sampling rates in which case a samplingaccessory could be provided. In this embodiment, one light path istherefore used to interrogate the sample, while the other is directed tobypass (not interrogate) the sample.

Throughout this disclosure these channels (211) and (213) or light pathsmay be referred to as a “sampling channel” and a “reference channel.”This is to refer to the fact that the sample channel (213) is generallyused when the electromagnetic radiation is directed through a samplewhile in the reference channel (211) the light is generally not directedthrough that sample, but is used for reference. One of ordinary skill inthe art, however, would recognize that the channels could be reversed inroles depending on embodiment and none or both of the channels couldinclude sample depending on the desired operation. For example, thereference channel (211) could include a gas correlation cell in anembodiment.

FIG. 2A provides a block diagram showing the conceptual layout of anembodiment of a spectroscope (100) of the present invention which, in anembodiment, is disposed within the spectroscope tool section (16) of anembodiment of the tool (10). The device of FIG. 2A generally comprises ahousing (101) into which other components are placed to shield them fromambient light. The housing (101) includes an input aperture (103) suchas a slit which will serve to provide the incident light to be used inthe spectroscope. The use of a slit will result in the light generallyhaving a spread spectrum of height depending on the height of the slit.The light source (102) may alternatively be provided in the housing(101) in which case it would have a predefined path formed in thehousing (101) for forming a light input of desired shape and size. Theincident light source (102) will generally provide light (130) of anumber of different wavelengths (broadband light). The incident lightthat passes through the slit (103) is directed onto a grating (105),prism, or other surface capable of separating the light into itsspectrum, which is used to spatially disperse light as a function ofwavelength.

This light is then projected onto an adaptive optical element which issome form of device which can change its surface or other opticalproperty to change the direction that light incident on it is directed.In an embodiment, this comprises an array of individually moveableminors. In the preferred embodiment, this is amicro-opto-electromechanical (MOEM) device comprising a Micro MinorArray (MMA) (107). In an embodiment, the MMA (107) comprises a DigitalMicromirror Device (DMD) such as those manufactured by TexasInstruments. The MMA (107) will generally comprise a large number ofminors of very small size which are arranged in a recognized pattern. Inmost embodiments, this will be a grid. The mirrors on the MMA (107) aregenerally independently positionable via a control system, (not shown)to at least two different positions. The MMA minors also can movebetween at least those two positions when such movement is requested bythe control system. In the depicted embodiment where the MMA is a DMD,the two positions are generally +10° and −10° from a predeterminedhorizontal position (0° position).

Details of the MMA are discussed in a subsequent section of thisdisclosure and illustrated in FIGS. 8A and 8B. For simplicity, FIGS. 2A,2B and 2C show only a single ray trace incidental on a single mirror(120) of the MMA (107).

Alternate means can be used to form the dispersed light (106). As anexample, the grating (105) can be replaced by a prism to redirect and todisperse light from the light source (103) onto the MMA device (107).Another alternate dispersed light source (not shown) can comprise anarray of narrow beam light sources such as, but not limited to, lightemitting diodes or lasers. Each element of the array is focused onto theMMA device (107).

Again referring to FIGS. 2A, 2B, and 2C, a single minor (120) of an MMA(107) is shown to illustrate the basic operational concepts of thespectroscope (100). The single mirror (120) is oriented within the MMA(107) in at least two discrete positions so that some or all of thevarious wavelengths of light (106) incident on the single mirror (120)is directed into two different channels, which are defined as the“sample” channel and the “reference” channel.

Referring to both FIGS. 2A and 2B, the single mirror (120) is orientedat an angle Θ₁, where Θ₁ is defined as the angle between the normal(142) of the MMA (107) and the normal (144) of the single minor (120).This orients the spectroscope (100) in the “sample” channel, whereinlight is reflected from the single mirror (120) to a minor (109), asillustrated conceptually by the ray path (213).

As illustrated in FIGS. 2B and 2C, the mirrors will generally beindependently arranged at two different states having different angularpositions. Generally, these two different positions may be angularlysymmetrical about a midpoint location simply for position stability. Forexample, if the midpoint was classified as a 0° state, the two positionscan be a +X° and −X° degree state from the 0° position. The midpoint isalso preferably chosen to correspond to the position where theindividual minor on the MMA is arranged generally parallel to thesubstrate of the MMA.

The minor (109) reflects light, as indicated conceptually by the raypath (215), out of the spectroscope housing (101) and into a light guide(138) such as a fiber optic cable. The light guide (138) includes asampling accessory (204) which is in contact with a fluid (180) to beanalyzed. The optical-response of the fluid as measured by the samplingaccessory (204) is returned via a light guide (138) to the spectroscope(100) and into a sample detector (203), as indicated conceptually by theray path (152). Spectroscopic response of the sample detector (203) toconstituents of the fluid (180) will be discussed in a subsequentsection of this disclosure. It should be recognized that ray paths (215)and (152) are simply continuations of ray path (213), but are indicatedwith separate references for clarity

The sampling accessory (204) can be, but is not limited to, a dipaccessory, a reflectance accessory, a transmittance accessory, afluorescence accessory, an Attenuated Total Reflectance (ATR) accessory,an extractive flow cell, or any other sampling or monitoring deviceknown to those familiar to the art.

The spectroscope can use Conventional Raster Scanning (CRS), HadamardTransform (HT), Fourier Transform (FT), or any other encoding methodsknown to those familiar to the art.

Now referring to both FIGS. 2A and 2C, the single mirror (120) isoriented at an angle Θ₂, where Θ₂ is defined as the angle between thenormal (142) of the MMA (107) and the normal (144) of the single minor(120). This orients the spectroscope (100) in the “reference” channel,wherein light is reflected from the single mirror (120) to a referencedetector (201), as indicated conceptually by the ray path (211). Thereference channel allows the sample channel response to be corrected inreal time for drift and other systematic changes as will be discussedsubsequently.

Referring to FIGS. 2A, 2B and 2C, the single minor (120) can be orientedso that the normal (142) of the MMA (107) is coincident with the normal(144) of individual minors of the MMA. This orients the spectroscope(100) so that light is directed into an optical trap (111), as indicatedconceptually by the ray path (137). This orientation is referred to asthe “zero degree” state, and could be used as one method for correctingthe sample and reference channels for dark current. Other methods ofdark current measurement are easily envisioned by directing the MMAmirrors away from the sample or reference channels as they are beingmeasured.

Using the above nomenclature to define the orientation of the MMA (107)(see FIGS. 2B and 2C), Θ₁ for the sample channel is preferably about+10°, Θ₂ for the reference channel is preferably about −10°, and theangle zero degree state is 0=0°. Note that the use of +10 and −10degrees is for illustrative purposes only and that the actual angleswill depend on the device used and while such angle may be used in anembodiment, generally there are +X° and −X° states. While the depictedembodiment utilizes mirrors that have three discrete states (+X°, 0,−X°), alternative embodiments may utilize an MMA with numerous mirrorpositions, such as an analog driven MMA or an MMA with only 2 discretepositions (such as those shown in FIGS. 2B and 2C) with no 0° state. Thespectroscope can use the position of the minors, either singly or in anycombination, to achieve the sample, reference and dark currentmeasurements.

FIGS. 9A, 9B, and 9C provide a series of general block diagrams ofembodiments of the spectroscope shown in the conceptual diagram of FIG.2A. Not shown for clarity are the optical elements (205) used to imagethe spectrally processed light (i.e. post MMA (107)) into the individualchannels. These figures are provided to show a possibility for how anactual optical path using the MMA (107) and two sample channels can beaccomplished. FIG. 10 provides for a conceptual layout of a spectroscopewhich includes two light inputs and essentially provides for four lightpaths by providing two spectroscopes (100) in the same housing (101) andusing the same MMA (107).

Light incident on the MMA (107) will be routed from the slit (103) andgrating (105) and potentially, may be further manipulated to improve,among other things, its shape, dispersion, or intensity. FIGS. 5 through7 provide for a number of embodiments of a spectroscope showing lightpath manipulation prior to the MMA (107). The various embodiments caninclude concave diffraction gratings (901), convex diffraction gratings(903), concave mirrors (905), or lenses (907) to manipulate the lightspectrum prior to it being incident on the MMA (107). In the embodimentsof FIGS. 5 through 7 there are also included a number of other lighthandling objects prior to the MMA including relay mirrors (961), lenses(907), and a telecentric lens (951) which is added to make all lightincident on the MMA (107) normal (perpendicular) to the MMA (107) face.There may also be included a filter (953). In this configuration, thespectrometer (100) can be used to recombine the light into the referencechannel (211) or sample channel (213). The design of FIG. 7 can providefor an athermal spectrometer (100) which can provide for improvedresolution and accuracy of resultant readings over a large temperaturerange.

FIG. 3 is a conceptual illustration of another embodiment of thespectroscope (100). Many of the elements and related fight ray paths arethe same as those depicted in FIG. 2A and for brevity are not redefined.There are, however, significant new elements in the embodiment. Thereference channel comprises a second mirror (109B) in addition to themirror in the sample channel, which is now denoted as (109A). The samplechannel configuration and operation is essentially the same as thesample channel depicted in the embodiment of FIG. 2A, when the singlemirror (120) of the MMA (107) is oriented at angle Θ₁. Light passes fromthe single minor (120) of the MMA (107), and is reflected by the minor(109A) as illustrated conceptually by the ray paths (213) and (215).Light then passes out of the spectrometer housing (101) and onto a lightconduit (138), such as a fiber optic cable. The path (215) passes into asample accessory (204) which is in contact with a sample (180) to beanalyzed. The optical response of the sample accessory (204) is returnedvia the optical conduit (138) to the spectroscope (100) and into asample detector (203), as indicated conceptually by the light path(152).

Again referring to FIG. 3, when the single minor (120) of the MMA (107)is oriented at angle Θ₂, light is reflected from the single mirror (120)to the minor (109B), as illustrated conceptually by the ray path (211).The mirror (109B) then reflects light, as indicated conceptually by theray path (215B), out of the spectroscope housing (101) and onto a lightconduit (138B) such as a fiber optic cable. The light path (215B) passesinto a reference accessory (304), which is in contact with a referencesample to be analyzed. The optical response of the reference accessory(304) is returned via the optical conduit (138B) to the spectroscope(100) and into a reference detector (201), as indicated conceptually bythe light path (152B).

As stated previously, light in the reference channel is directed througha reference accessory (304) via the light conduits (138B). The referenceaccessory (304) can comprise a holmium standard, gas correlation cell,and/or any other calibration, reference material or standard known tothose familiar to the art.

Still referring to FIG. 3, the MMA (107) alternately operates in thesample and standard channels. Corresponding spectroscopic responses aremeasured in the fluid (180) by sample accessory (204), and in thereference accessory (304). Since, by definition, the spectroscopicresponse of the reference accessory is a “reference standard”, thespectroscopic fluid response can be compared continuously with thereference accessory spectroscopic response, and any systematic variationwithin the spectroscope (100) can be measured and used to correct fluidresponse for these variations, which include gain and base line drift.

FIG. 4 is another conceptual embodiment of the spectroscope (100). Manyof the elements and related light ray paths are similar to thosedepicted in the prior embodiments and, for brevity, will not beredefined. There are, however, also significant new elements in thisembodiment. The reference channel comprises a first light path (252)direct from a splitter (270) on the light source (102) and slit (103).The second light path (253) from the splitter (270) is sent to thesampling accessory (204). The return light (256) from the samplingaccessory (204) is directed onto a grating (105) that is used todisperse the light as a function of wavelength. This dispersed light,represented conceptually by the ray path (257), is projected on an MMAdevice (107). A single minor (120) is again shown for purposes ofillustration. The MMA device (107) is used to filter the light based onwavelength. This filtered light is subsequently directed from the MMAdevice (107) via path (262) to a first sample detector S1 shown at(203A), or via a path (260) to a second sample detector S2 shown at(203B). A dark current measurement for the first sample detector (203A)can be made by projecting all light away from this detector and at anangle Θ_(B) into the sample detector (203B) via the light path (260).Conversely, a dark current measurement for the second sample detector(203B) can be made by projecting all light away from this detector andat an angle θ_(A) into the sample detector (203A) via the light path(262). Measurements from both sample detectors S1 (203A) and S2 (203B)can be used for additional calibration information, to reduceacquisition time, or to minimize the effects of noise and/or drift.

The light incident on the MMA (107) is generally in the form of a spreadspectrum. That is, the component wavelengths of the light will bespatially separated from each other by being bent through differentangles at a time prior to being incident on the MMA (107). Such lightwill generally have a spectrum going from light having longer wavelength(red and infrared) to light being shorter wavelength (violet andultraviolet). The spectrum of light (801) is shown as the dark outlinerectangle (801) in FIGS. 11A and 11B with the one end representingshorter wavelength light and the other end longer wavelength light. Itshould be recognized that points directly vertical of each other inFIGS. 11A and 11B are the same wavelength. Therefore making “rows” inthe spectrum correspond to the spatial dimension of the input slit,while “columns” in the spectrum correspond to the spectral dimension ofdispersion.

The MMA (107) is positioned in the housing (101) so that some or all ofthe various wavelengths incident on the MMA (107) are directed into thetwo different channels (211) and (213) or (260) and (262) depending onembodiment. For simplicity, the discussion will refer to channels (211)and (213) although channels (260) and (262) could be used instead,depending on embodiment. Each channel is associated with a detector(201) or (203) based on the positioning of the various minors of the MMA(107). Light routing is dependent on the specific MMA (107) minorposition relative to the incident radiation. That is, the wavelengthsare “spectrally” filtered by the MMA (107) between the light channels(211) and (213). In order to direct specific wavelengths of the incidentlight within the appropriate channel (211) or (213), devices such asminors (961) can be placed in the various paths to direct thewavelengths incident on them as appropriate for that channel (211) or(213).

It is important to recognize that the MMA (107) does not act as a beamsplitter or other device which sends part of the intensity down eachpath. Instead, the MMA (107) sends a portion of the spectrum down eachpath exclusive of the other. For example, the MMA (107) could send thered, orange, yellow, and green portion of the visible spectrum down onepath and the blue, indigo, and violet portion of the same spectrum downthe other path. This would mean that if the first path is referencechannel (213), detector (203) would not have any blue, indigo or violetincident thereon at that time.

Alternatively or additionally, a series of order sorting filters,folding minors, and/or collimating lenses or focusing lenses (205), canbe utilized to collect and image polychromatic, or monochromatic, lightfrom the MMA (107), onto the appropriate detectors (201) or (203) forspectral processing. One should recognize that the embodiment of FIG. 7allows for minors and other components to be used for a number ofdifferent purposes depending on whether light is incident on, orreflected from the MMA (107). In another embodiment, the spectrumincident on the MMA (107) can be temporally structured or spatiallyfiltered in addition to or instead of the spectral filtering discussed.

Detectors (201) and (203) may measure any form or spectrum of light and,in an embodiment, detectors (201) and (203) utilize two single elementphotodiodes (PDs) as detectors. In an alternative configuration thedetectors (201) and (203) could utilize two-dimensional (2D) chargecoupled devices (CCDs) or photo diode arrays (PDAs). In still furtherembodiments, the detectors (201) and (203) comprise, but are not limitedto Photo Multiplier Tubes (PMTs), Avalanche Photo Diodes (APDs), CMOSdetectors, Bolometers, any other detector known to those of ordinaryskill in the art, or any combination of these detectors.

In the various embodiments discussed herein, the spectroscope (101) ispreferably attached to a sampling accessory (204) which allows onechannel of light to interact with a test sample and then to return theoutput radiation to the sample detector (203) and eventually the controlsystem. The sampling accessory (204) could be, but is not limited to, afiber optic based accessory, a transmission dip probe, a reflectanceprobe, a fluorescence probe, an extractive flow cell, other samplingdevices known to those of ordinary skill in the art, or any combinationof sampling devices.

FIGS. 8A and 8B illustrate a conceptual drawing of a potential samplingmode of the spectroscope (100) of FIG. 2A. In FIGS. 8A and 8B, the MMA(107) is used as a spectral filter, with sampling occurring using one ormore narrow bands of radiation at a time. FIG. 8A illustrates spectralfiltering where a single narrow band of radiation (or even singlewavelength) is used to probe the sample. The selected band is narrowband (311). In FIG. 8A, this band (311) would be traveling down thereference channel (211) and is therefore incident on the referencedetector (201) while the remaining bands (313) are traveling down samplechannel (213) and are imaged on the sample detector (203). Therefore, inthis situation, the band (311) is not incident on the sample but isbypassing the sample. Since this band (311) is desired for sampleinterrogation, the signal generated by the band (311) at the referencedetector (201) in this situation therefore represents a “non-sample”signal which can be used as a reference. The output of the sampledetector (203) in this arrangement is being generated from a portion ofthe spectrum which may or may not be of interest. In particular, theintensity, dispersion, wavelengths, bandwidth, or any othercharacteristic of the band (311) may be detected by detector (201). Thatis, a base or reference determination of the band (311) may beestablished.

In FIG. 8B the band (311) is now directed down the sample channel (213)to the sample detector (203) with the remaining bands (313) directeddown the reference channel (211) to reference detector (201). Now theoutput of sample detector (203) is of interest as the sample is beinginterrogated by the desired spectrum. The percent transmission orabsorbance or other measurable values can be calculated based onmeasurements from both the sample and reference channels by comparingthe output of the detectors (201) and (203). As should be apparent,because the switch between the two channels having the spectrum ofinterest can occur relatively quickly and repeatedly, the output of thereference detector (201) can be used to normalize the output of thesample detector (203) to provide for a scaled reading. So as to providefor the most accurate referencing, the two detectors (201) and (203)will generally be similar so that the output of the light interactingwith the sample and not interacting with the sample are incident onsimilar detectors.

As should be apparent from FIGS. 8A and 8B, the switching of the band(311) from reference detector (201) to sample detector (203) (and thecorresponding movement of bands (313)) is accomplished by adjustment ofthe state of the individual minors in the MMA (107). In particular,referring to FIGS. 11A and 11B, the spectrum incident on the MMA (107)is spread across the mirrors of the MMA (107) so that differentwavelengths are incident on different portions of the MMA (107)generally with an individual wavelength, or small wavelength band beingincident on each mirror in the array as shown. Each individual minorcomponent of the MMA (107) can be adjusted independently between atleast the two different states as previously discussed. This allows foreach of the bands (311) and (313) in FIGS. 8A and 8B to be independentlysent to either the reference (201) or sample (203) detector simply by aselected arrangement of the mirrors.

The incident light is preferably directed toward the MMA (107) in such away that the change in each minor, or more particularly changes in arow, column or diagonal of minors can direct a particular wavelength ornarrow band of wavelengths to a particular path. Two differentmethodologies for this are shown in FIG. 11. In FIG. 11A, the spectrum(801) is incident on the MMA (107) grid so as to generally align eachfrequency of light with a column (or row) of minors. For reference,column (811) in this case is generally aligned with a small band ofwavelengths (821) in the middle area, while column (813) is generallyaligned with a small band of wavelengths (823) neighboring band (821).Other bands would be aligned with other columns in a similar fashion.Should the band of wavelengths (821) in column (811) be desired formeasuring, the mirrors in that column (811) will be offset from theother mirrors on the MMA (107) in their position. Specifically, thecolumn (811) will generally be at position +X (corresponding, forexample, to light channel (211)) when the remaining columns (includingcolumn (813)) are generally at position −X (corresponding, for example,to light channel (213)) and vice-versa.

As is readily apparent, a single column need not be segregated and anysingle column or combination of columns, up to and including all columnscan be included in the segregation. Each of the segregated columns maythen be used to interrogate the sample and be referenced as the MMA(107) mirrors shift between positions. As should also be recognized, theunselected columns can also additionally or alternatively be used tointerrogate the sample as the two groups cycle between the two channels(211) and (213).

FIG. 11B provides for an alternative arrangement. In FIG. 11B thespectrum band (821) is arranged on a diagonal (815) with the MMA (107).This provides much of same functionality of FIG. 11A, but because of theorientation of each minor relative the spectrum (with part of each bandoverlapping neighboring bands) an additional form of optical smoothingcan be achieved by segregating various diagonals instead of columns.

The ability of the MMA (107) to provide for any number of wavelengthbands, as selected, being used for the evaluation can allow thespectroscope (100) to perform a large number of dynamic adjustments onthe resultant signals received from the sample. Because the wavelengthbands (821) can be individually segregated and therefore acted upon, auser can select the nature of their interrogation of the sample in awavelength dependent fashion.

For example, FIG. 12 provides for a hypothetical graph showing the MMA(107) being used to allow for dynamic resolution control. The line(1101) is a much smoother curve and can be generated by having a largenumber of columns (811) be selected to interrogate simultaneously. Onthe other hand, line (1103) can be generated by having each individualcolumn be used to interrogate separately. In this latter situation, thedetermination is much more exact as to absorbance of a smallerwavelength band, but the evaluation will generally take more time.Depending on the type of data output desired, one can select the mode ofoperation at the time of use.

FIG. 13 provides for another such wavelength dependent structuring ofthe interrogation. In this hypothetical, the MMA (107) is used todynamically improve signal to noise. Line (1111) is a noisy signal atboth ends representing the normal occurrence with broad band lightsources. The dashed line (1113), illustrates how the MMA can provideuniform intensity across the entire wavelength range through dynamicadjustment of the integration period, number of columns passing light,the number of rows in the column, or a plurality of other controlschemes. in the most common implementation this allows the detector tointegrate over a longer period of time which allows the end wavelengthsto provide equivalent intensity compared to the center wavelength regioneffectively leveling out the percentage of transmission at allwavelengths. Alternatively, one skilled in the art would recognize thatsignal-to-noise can be equilibrated by controlling the minors' dutycycle, or by simply scaling the integration time for each band (821) sothat the equivalent signal response results from each band beingmeasured. In doing so, the reference channel could also be measured in acomparable fashion.

FIG. 14 provides a representation of dynamic filtering. In FIG. 14A,there is provided a particular wavelength band (1131) of light whichrepresents a saturated signal response. With certain configurations,such a saturated signal response may obscure or bias the details of thesmaller signal responses (1133), (1135), and (1137). In FIG. 14B, thesections of the spectrum corresponding to the problematic wavelengthshave been cut out, eliminating any transmission at that wavelength andallowing the smaller peaks (1133), (1135), and (1137) to be relativelymore prominent.

FIG. 15 provides for adjustment of the sample channel by dynamic scalingor normalization over time. It is known that over time the operation ofa spectroscope will change, causing the measured spectrum to change dueto parts heating up or wearing out. This is particularly true of lightsources. This is indicated by line (1141) showing how over time thetransmission of a given wavelength has drifted. Effectively, this causesthe spectroscope to loose its calibration. Because such changes can bedetected by the reference channel (211) as not being due to the sample,the dynamic reference capability of the spectroscope (100) can beutilized to correct for the loss in calibration thereby allowing theactual percent transmission to approach the ideal (1143).

FIGS. 12 through 15 have provided for a number of different benefitsfrom the ability to dynamically reference by providing two optical paths(211) and (213). In particular, the spectroscope (100) can provide forwavelength dependent structuring of the spectrum which is used tointerrogate the sample. This structuring may be spatial structuringwhere particular elements of the light are controlled based on theirspatial positioning, or may be temporal structuring where the light ismodulated over time.

In operation, any mirror arranged at the preselected +X° state willdirect incident wavelengths toward the sample detector (203) whilemirrors at the −X° state will direct incident wavelengths toward thereference detector (201) or vice-versa, depending on specificarrangement. Further, when the mirrors are between states, the light maybe directed into a light trap (111) as shown in FIG. 2A.

It should be apparent that with a generally single wavelength, or smallwavelength band, incident on each of the minors in the MMA (107), onecan adjust the mirrors to supply those wavelength bands incident on theminors, to either detector (201) and (203) individually, or in anycombination. The mid point (or 0°) state on most current MMA (107)devices is generally unstable and therefore light cannot be reliablydirected using this state at this time. However, it can be recognizedthat if a third position of the minor is sufficiently stable, which isbelieved to be soon obtainable with current technology, this positioncan be used to provide for a discrete third channel. In a preferredembodiment, this third channel would be for a dark signal measurementwhere there is no light incident on either the reference channel (211)or sample channel (213). As indicated in FIG. 2A, with the mirrorsarranged at a third state (such as)0° the wavelengths are directed intoan optical trap (111), rendering both detectors (201) and (203)temporarily dark. This allows each detector (201) and (203) to take a“dark signal” measurement simultaneously saving processing steps.Additionally, even without the third position, all wavelengths can bedirected to either detector (201) or (203) thereby removing all incidentradiation from the other detector (201) or (203), which also enablesnear real-time dark signal measurement at the currently dark detector(201) or (203). This operation provides for additional calibration indetermining “dark noise” (the thermal response of detectors (201) and(203) as well as any light incident on the detectors (201) and (203)which is not being purposefully directed to them by action of the MMA(107)), which can then be nulled by the spectroscope (100) controlsystem.

It will also be understood that while FIGS. 8A and 8B shows themonitoring of a single band in a scanning mode. FIGS. 16A and 16Bprovide for a couple of examples of how spectrum columns (821) can bemodified to perform some types of structuring. In FIG. 16A, each columnhas its bandwidth frequency modulated at independent frequencies so asto provide for Fast Fourier Transform (FFT) analysis. In an alternativeapproach shown in FIG. 16B instead of modulating each wavelength at adifferent frequency, each band can be modulated at the same frequencysequentially to provide signal-to-noise improvement via opticalchopping. The spectroscope (100) can also be used to measure multiplebands simultaneously using the MMA (107) to temporally process theincident radiation simply by altering the frequency that each individualwavelength band is modulated. This in turn imparts a temporal structureto the incident radiation. This methodology enables the spectroscope(100) to read all wavelengths simultaneously, or multiplexed, as opposedto individually scanning each individual wavelength or wavelength bandat either detector (201) or (203). This is simply an alternative methodfor spectral processing utilizing the same spectroscope (100). While theembodiment shown in FIG. 2A uses the MMA (107) for spectral filtering,an alternative embodiment may use the MMA (107) for spatial, spectral,or temporal filtering, thus enabling an alternative means of dataprocessing, such as Hadamard Transform Spectroscopy or Fourier TransformSpectroscopy respectively.

The use of an MMA for Hadamard Transform Spectroscopy and FourierTransform spectroscopy has been documented by DeVerse et al. in“Realization of the Hadamard Multiplex Advantage Using a ProgrammableOptical Mask in a Dispersive Flat-Field Near-Infrared Spectrometer.”Applied Spectroscopy, vol. 54 No. 12, pgs. 1751-1758 (2000), the entiredisclosure of which is herein incorporated by reference. However, inDeVerse, implementations were limited due to the fact that only a singleoptical channel was utilized. Operating the spectroscope (100) as aHadamard or Fourier Transform spectral analyzer and utilizing the dualchannel nature of spectroscope (100), and algorithms known to thoseversed in the art of signal processing to deconvolute the reference andsample channels spectral content, the spectroscope (100) is able todynamically calibrate itself and/or scale output using implementationssimilar to those of DeVerse.

Further, it should be recognized that the spectroscope (100) isgenerally not limited by hardware configuration to any particularanalysis technique but may be used for a variety of spectroscopytechniques including, but not limited to, those described in Spudich etal. “Potential for Using a Digital Micromirror Device as a SignalMultiplexer in Visible Spectroscopy.” Applied Spectroscopy, vol. 57 No.7, pgs. 733-736 (2003); U.S. Pat. No. 6,781,691; and United StatesPatent Publications US 2004/0239923 and US 2004/0169858. The entiredisclosure of all of these documents is herein incorporated byreference.

Generally, as should be apparent from the figures, the spectroscope(100), utilizing the MMA (107), allows for the control system to selectany wavelength band or bands for sampling, and to temporally structurebands, without requiring hardware reconfiguration. Instead, thecomponent wavelength band(s) desired is simply selected by the controlsystem based on what is available in the incident light, and how itinstructs the MMA (107) operation. After that, the selected band(s)being used for sampling can be referenced against a reference signalwith relative ease simply by redirecting the band(s) to the referencepath. The measurement of a sample therefore shows good accuracy andstability for a spectroscope (100) having a high number of useable andalterable spectrums without need of hardware reconfiguration.

In operation, the spectroscope (100) in use in a fluid processing systemtool (10) may evaluate formation fluid while within a hydrocarbon well.Oil, water, and gas are major constituents of fluids produced inhydrocarbon wells although other materials may also be present. FIG. 17is a plot of optical density in arbitrary units (ordinate) versuswavelength λ in nanometers (nm) (abscissa) for oil, water and gas.Curves (320), (322) and (326) represent oil, water and gas,respectively. It is apparent that each constituent exhibits at least onesignificant diversion or “peak.” As an example, water exhibits two largepeaks at approximately 1450±50 nm and 1940±50 nm. Methane exhibits astrong peak in the range of about 1600 nm to 1650 nm. Hydrocarbon isassociated with the peak structure in the range of 1650 nm to 1780 nm.Additionally, both carbon dioxide (CO₂) and hydrogen sulfide (H₂S) aremeasurable in the near infra-red region under specific concentrationconditions. Heavy crude oil exhibits a large continuum belowapproximately 1100 nm whereas light curdes have a measurable absorbanceresponse in the visible spectral region. It is apparent that oil, waterand gas exhibit unique spectral characteristics. A measure of a spectrumof the type illustrated in FIG. 17 can, therefore, be used to identifyconstituents of fluid and the device of FIG. 2A may be used to measuresuch a spectrum by sampling fluids present downhole. Furthermore, themagnitude of components of a measured composite spectrum can be used toobtain concentrations of constituents. In addition, the measuredspectrum can be used to obtain other physical or chemical properties.

In view of the above discussion of the operation of the spectroscope(100), it is apparent that the MMA (107) can be configured so that lightof one or more predetermined wavelengths impinges upon the fluid (180).This renders the spectroscopic measurement sensitive to one or moreconstituents of the fluid. As an example, if the spectroscope (100) isconfigured to emit light at λ=1450±50 nm and 1940±50 nm bands in thesample channel, the spectroscopic response of the sample channel will bemost sensitive to the water constituent in the fluid (180). As anotherexample, the spectroscope (100) can be configured so that the samplechannel “sweeps” wavelengths over a predetermined range of energy bands.As an example, the spectroscope (100) can be configured to emit samplelight in contiguous energy bands of 10 nm in width, and ranging from1000 to 2100 nm. The spectroscopic response of the spectroscope (100)will yield a spectrum, with components representing oil gas and waterconstituents, of the form shown in FIG. 17. The measured spectrum canthen be used to determine relative concentrations of the fluidconstituents using a variety of spectral analyses methodologies. Inaddition, the measured spectrum can be used to obtain other physical orchemical properties.

Processing of the measured data can be performed in the downholeprocessor disposed preferably in the spectroscope tool section (16) ofthe tool (10), in the surface processor disposed in the surfaceequipment (32), or in both processors. Downhole or surface processing ofthe data may be governed by the configuration of the formation testersystem and the telemetry bandwidth available. Alternately, tool responsedata can be stored in memory within or operatively connected to the tool(10) for retrieval at the surface. Results may be tabulated as afunction of time and/or depth at which they are measured, and output bythe surface equipment (32) using any desired reporting format including,but not limited to a “log” or a “strip chart”.

Embodied as a wellbore fluid analysis system (5), the tool (10) istypically disposed at a predetermined depth within the wellbore (28) inwhich fluid is flowing, either from an over pressured producingformation or from the action of a well pump. The probe section (12)comprises an input port through which fluid flows into the tool (10). Asin the production logging tool embodiment, the pump tool section (20)and the sample tool section (18) (see FIG. 1) are not required. Fluidflow through the tool (10), and measurements made with the tool (10),are both essentially the same as described in the production loggingembodiment. The tool (10) measures fluid properties as a function oftime and/or depth. Fluid monitoring time can span days or even weeks.Once again, the typical parameters of interest are related to the oil,water and gas constituents and the chemical and physical properties ofthe flowing fluid.

As mentioned previously, the spectroscope (100) can be embodied in aproduction logging system. Referring to FIG. 1, the pump tool section(20) and the sample tool section (18) are not required in an embodimentdesigned for production logging. In a production logging embodiment, thetool (10) is conveyed along the wellbore (28). The probe section (12)comprises a port into which wellbore fluid flows due to the relativemotion of the conveyed tool (10) or the produced fluid. Fluid may flowthrough the auxiliary section (14), wherein measurements related tofluid constituent phase flow rates, composite fluid density, phaseholdup factors and any other desired parameter can be made. Fluid maythen flow through the spectroscope tool section (16). Measurementsrelated to the constituents, chemical and/or physical properties of thefluid are made in the spectroscope tool section (16), as described inprevious sections of this disclosure. After flowing through thespectroscope tool section (16), the fluid exits the tool (10) through anexit port (not shown) and returns to the wellbore (28). Spectroscopicmeasurements are combined with measurements from the auxiliary section,in the processor (not shown) preferably in the spectroscope tool section(16), to obtain production logging parameters of interest such as volumeflow rates for oil, water and gas. These parameters of interest are madeas a function of time and/or depth (40) in the wellbore (28) therebygenerating a production log.

While the invention has been disclosed in connection with certainpreferred embodiments, this should not be taken as a limitation to allof the provided details. Modifications and variations of the describedembodiments may be made without departing from the spirit and scope ofthe invention, and other embodiments should be understood to beencompassed in the present disclosure as would be understood by those ofordinary skill in the art.

1. A tool for measuring properties of a formation fluid downhole withina wellbore, the tool comprising: means for isolating a portion of anearth formation; means for obtaining a sample of formation fluid fromsaid isolated portion; and a spectroscope tool comprising: aspectroscope, the spectroscope including: a sample channel thatevaluates said fluid; a reference channel; and an adaptive opticalelement which comprises elements that are sequentially oriented todirect light, at sample wavelength, into the sample channel and into thereference channel; wherein response of the sample channel and responseof the reference channel are combined to yield a measure of a propertyof said fluid and to correct the measure for environmental changes inthe spectroscope.
 2. The tool of claim 1 wherein said spectroscopeevaluates at least one chemical or physical property of said fluidwithin said wellbore.
 3. The tool of claim 1 wherein said tool is partof a wireline formation tester system.
 4. The tool of claim 1 whereinsaid tool is part of a production logging system.
 5. The tool of claim 1wherein said tool is part of downhole fluid analysis system.
 6. The toolof claim 1 wherein said tool is part of a Logging WhileDrilling/Measurement While Drilling (LWD/MWD) formation tester system.7. The tool of claim 1 wherein said spectroscope further comprises meansfor determining spectroscope dark current.
 8. The tool of claim 7further comprising: A control system which orients elements of theadaptive optical element such that the light is directed away fromeither the sample channel or the reference channel, and responses of thereference detector and sample detector, respectively, are used todetermine the respective channel dark currents.
 9. A tool for measuringproperties of a formation fluid downhole within a wellbore, the toolcomprising: a port for obtaining a sample of fluid downhole; and aspectroscope including: an adaptive optical element capable of directinga first wavelength band along a first light path and a second wavelengthband along a second light path when both said bands are simultaneouslyincident on said adaptive optical element; a light source incident onsaid sample and producing a spectrum; and at least two detectors;wherein said spectrum is spectrally dispersed across said adaptiveoptical element in such fashion that a first wavelength band in saidspectrum is directed along said first light path to a first of said atleast two detectors; and wherein a second wavelength band in saidspectrum is directed along said second light path to a second of said atleast two detectors.
 10. The tool of claim 9 wherein said spectroscopeevaluates at least one chemical or physical property of said fluidwithin said wellbore.
 11. The tool of claim 9 wherein said tool is partof a wireline formation tester system.
 12. The tool of claim 9 whereinsaid tool is part of a production logging system.
 13. The tool of claim9 wherein said tool is part of downhole fluid analysis system.
 14. Thetool of claim 9 wherein said tool is part of a Logging WhileDrilling/Measurement While Drilling (LWD/MWD) formation tester system.15. The tool of claim 9 wherein said spectroscope further comprisesmeans for determining spectroscope dark current.
 16. The tool of claim15 further comprising: A control system which orients elements of theadaptive optical element such that the light is directed away fromeither the sample channel or the reference channel, and responses of thereference detector and sample detector, respectively, are used todetermine the respective channel dark currents.
 17. A method formeasuring properties of a formation fluid downhole within a wellbore,the tool comprising: providing a spectroscope within said wellbore, saidspectroscope including an adaptive optical element capable of directinga first wavelength band along a first light path and a second wavelengthband along a second light path when both said bands are simultaneouslyincident on said adaptive optical element; obtaining a sample of fluiddownhole; and without removing said fluid from downhole, illuminatingsaid sample with light so as to produce a spectrum which is spectrallydispersed across said adaptive optical element in such fashion that afirst wavelength band in said spectrum is directed along said firstlight path and a second wavelength band in said spectrum is directedalong said second light path, and determining a measure of a property ofat least a portion of said sample from both said first and said secondwavelength bands.
 18. The method of claim 19 wherein said method isperformed by a wireline formation tester system.
 19. The method of claim19 wherein said method is performed by a production logging system. 20.The method of claim 19 wherein said method is performed by a downholefluid analysis system.
 21. The method of claim 19 wherein said method isperformed by a Logging While Drilling/Measurement While Drilling(LWD/MWD) formation tester system.
 22. The method of claim 19 whereinsaid spectroscope further comprises means for determining spectroscopedark current.